Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope. Advances in Military Technology, [S. l.], v. 8, n. 1, p. 59–69, 2022. Disponível em: https://www.aimt.cz/index.php/aimt/article/view/1573.. Acesso em: 4 may. 2024.